Reliability Testing by Precise Electrical Measurement
نویسندگان
چکیده
Manyof the lllechanismsthat lead to the ultimate failure of an integrated circuit maybe evident early in the life of a device and should be detectable if sufficiently precise electrical llleasurements are made. A variety of tests have been I114deon mediumscale CMOScircuits to evaluate this hypothesis. These have included leakage current, transient current, electrical noise, upper cut off frequency and delay times. The devices under test have been stressed to accelerate ageing and the results of the diagnostic electrical llleasurements correlated with subsequent failure. Consideration has been given to the implementation of the reliability tests in conjunction with the nOClllal functional testin'l.
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